The ARS2000 Angle-Resolved Spectrometer is a portable fiber optic spectrometer designed for variable-angle transmission and reflection measurements in laboratory and field environments. It enables transmission, reflection, absorption, and emission spectroscopy under different incident and collection angles.
The system is ideally suited for research on photonic crystals, superconducting materials, and other nanophotonic materials by measuring their angle-dependent optical properties, including reflectance, transmittance, and absorption. These measurements help characterize crystal band structures, material defects, and other optical characteristics. It is also widely used for process monitoring and quality control of thin films, glass, and optical components.
Equipped with a manual transmission/reflection measurement stage, the ARS2000 supports an incident angle range of 0°–180° and a collection angle range of 0°–360°, enabling transmission, reflection, and emission spectral measurements over the 200–1100 nm wavelength range.
An integrated ARM-based embedded controller with Uspectral Plus software enables standalone operation and real-time measurements. Dedicated Windows software is also included for advanced spectral analysis, data management, and report generation.
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Features
- Professional performance – Supports transmission, reflection, scattering, and emission spectral measurements for angle-resolved optical characterization.
- Compact & easy to use – Compact, stable, easy to maintain, and suitable for laboratory and field applications.
- Powerful SOFTWARE – Includes Uspectral Plus software for spectral acquisition, analysis, and data management.
- USB data storage – Easily save and export measurement data via the USB interface.
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Specification
Note: Custom wavelength ranges are available upon request.Model ARS2000 Spectral Range 200–1100 nm Fiber Configuration 600 μm UV-VIS Fiber Light Source 20 W Tungsten-Halogen Lamp Fiber Interface SMA905 Incident Angle 0°–180° Collection Angle 0°–360° Angular Resolution 0.003° Sample Stage XY ±6.5 cm Spot Diameter 10 cm Power Supply AC 220 V
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Applications
- Light source characterization
- Optical coating analysis
- Photonic crystal research
- LCD and display materials
- Optical sensor development
- Angle-dependent material analysis
- Nanophotonic materials
- Optical component characterization
- Thin-film process monitoring and quality control
- Refractive index curves
By measuring the reflectance, transmittance, and absorption of photonic crystals, superconducting materials, and other nanophotonic materials at different angles, the system enables the characterization of electronic band structures, material defects, and other angle-dependent optical properties. It is well suited for testing and research involving optical coatings, photonic crystals, LCD materials, optical sensor devices, and other angle-dependent material analyses.
